Benchmarking deep learning models for surface defect detection: a reproducible and statistically-rigorous approach

Darío G. Lema, Lídia Sánchez-González, Rubén Usamentiaga, Francisco J. delaCalle

Journal of Intelligent Manufacturing 2025 article cited by 13

importance 3/10 ai assisted Industrial Vision Systems and Defect Detection manufacturing quality control stage: research

Comparing deep learning defect-detection models is unreliable because varying dataset partitions and stochastic training introduce variable outcomes.

Unreliable model comparison can lead to wrong choices about defect-detection systems in manufacturing.

Proposed a statistically rigorous, reproducible benchmarking methodology using ANOVA and Tukey's test, designed for small datasets, demonstrated on object detection models with the Northeastern University surface defect dataset.

not stated in source

Provides a reliable framework for comparing defect-detection models, per the abstract.

Venue Journal of Intelligent Manufacturing
Published 2025
Work type article
Authors Darío G. Lema, Lídia Sánchez-González, Rubén Usamentiaga, Francisco J. delaCalle
Citations 13 (OpenAlex, at import time)
References 40
Model or method not stated in source
Organization not stated in source
Primary source https://doi.org/10.1007/s10845-025-02672-8
Open access hybrid
Keywords deep learning, defect detection, benchmarking, ANOVA, object detection
3 / 10

incremental / niche

Reproducible statistical benchmarking for defect-detection models; a real but narrow methodological advance for manufacturing QC, no scale stated.

Basis: inferred. Judged from the source text, which gives no explicit scale. Stated scale: not stated in source. Method and limits.

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